NSN 5961-01-299-6352 · NIIN 012996352 · FSC 5961
NO DASHES 5961012996352
In Stock
SEMICONDUCTOR DEVICE,DIODE
Semiconductor Devices and Associated Hardware
Technical characteristics
16 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABHP | OVERALL LENGTH | INCHES MAXIMUM 0.300 |
| ABJT | TERMINAL LENGTH | INCHES MINIMUM 1.000 |
| ADAV | OVERALL DIAMETER | INCHES MAXIMUM 0.107 |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-7 |
| AXGY | MOUNTING METHOD | TERMINAL |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE AND QUALITY ASSURANCE LEVEL TX |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | NOMINAL NOMINAL REGULATOR VOLTAGE 9.0 |
| CTQS | VOLTAGE TOLERANCE IN PERCENT | -5.0 TO 5.0 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | MILLIAMPERES NOMINAL VOLTAGE REGULATOR DIODE CURRENT 7.50 AND MILLIAMPERES MAXIMUM MAXIMUM DC CURRENT IN REVERSE BREAKDOWN REGION 50.00 |
| CTRD | POWER RATING PER CHARACTERISTIC | MILLIWATTS MAXIMUM TOTAL POWER DISSIPATION 500.0 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS AMBIENT AIR 175.0 |
| MATT | MATERIAL | SEMICONDUCTOR SILICON |
| MATT | MATERIAL | ENCLOSURE GLASS |
| TEST | TEST DATA DOCUMENT | SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). 81349--IL-S-19500 |
| TTQY | TERMINAL TYPE AND QUANTITY | UNINSULATED WIRE LEAD 2 |
| ZZZK | SPECIFICATION/STANDARD DATA | GOVERNMENT SPECIFICATION 81349--IL-S-19500 TO 156 |
Supersedes
This item replaces cancelled NIINs 008561832 · 010990873. An older drawing citing one of those numbers resolves here.