NSN 5962-00-134-1565 · NIIN 001341565 · FSC 5962
NO DASHES 5962001341565
In Stock
MICROCIRCUIT,MEMORY
Microcircuits, Electronic
Application: TEST STATION,GUIDED MISSILE REMOTE CONTROLSYSTEM AN/AWM-23
Technical characteristics
17 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 40.0 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM DELAY 50.00 |
| CZER | MEMORY DEVICE TYPE | DIODE MATRIX |
| TTQY | TERMINAL TYPE AND QUANTITY | PRINTED CIRCUIT 16 |
| CQWX | OUTPUT LOGIC FORM | CURRENT-MODE LOGIC |
| ADAQ | BODY LENGTH | INCHES MAXIMUM 0.785 |
| ADAT | BODY WIDTH | INCHES MAXIMUM 0.280 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.180 |
| AEHX | MAXIMUM POWER DISSIPATION RATING | MILLIWATTS 450.0 |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| AGAV | END ITEM IDENTIFICATION | TEST STATION,GUIDED MISSILE REMOTE CONTROLSYSTEM AN/AWM-23 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND HIGH VOLTAGE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQZP | INPUT CIRCUIT PATTERN | 6 INPUT |