NSN 5961-00-164-2032 · NIIN 001642032 · FSC 5961
NO DASHES 5961001642032
In Stock
SEMICONDUCTOR DEVICE,DIODE
Semiconductor Devices and Associated Hardware
Technical characteristics
18 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABHP | OVERALL LENGTH | INCHES MAXIMUM 1.573 |
| ABKW | OVERALL HEIGHT | INCHES MAXIMUM 0.380 |
| ABMK | OVERALL WIDTH | INCHES MAXIMUM 1.050 |
| AKPV | MOUNTING FACILITY QUANTITY | 2 |
| AXGY | MOUNTING METHOD | UNTHREADED HOLE(S) |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | NOMINAL NOMINAL REGULATOR VOLTAGE 51.0 |
| CTQS | VOLTAGE TOLERANCE IN PERCENT | -5.0 TO 5.0 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | MILLIAMPERES MAXIMUM MAXIMUM DC CURRENT IN REVERSE BREAKDOWN REGION 900.00 AND MILLIAMPERES NOMINAL VOLTAGE REGULATOR DIODE CURRENT 245.00 |
| CTRD | POWER RATING PER CHARACTERISTIC | WATTS MAXIMUM TOTAL POWER DISSIPATION 50.0 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS AMBIENT AIR 175.0 |
| FEAT | SPECIAL FEATURES | DESIGN ANALYSIS |
| MATT | MATERIAL | SEMICONDUCTOR SILICON |
| NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
| TEST | TEST DATA DOCUMENT | SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). 81349--IL-S-19500 |
| TTQY | TERMINAL TYPE AND QUANTITY | PIN 2 |
| ZZZK | SPECIFICATION/STANDARD DATA | GOVERNMENT SPECIFICATION 81349--IL-S-19500 TO 114 |
Supersedes
This item replaces cancelled NIIN 000571958. An older drawing citing one of those numbers resolves here.