NSN 5961-00-486-6074 · NIIN 004866074 · FSC 5961
NO DASHES 5961004866074
In Stock
SEMICONDUCTOR DEVICE,DIODE
Semiconductor Devices and Associated Hardware
Technical characteristics
15 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| MATT | MATERIAL | SEMICONDUCTOR SILICON |
| CCDG | OVERALL WIDTH ACROSS FLATS | INCHES NOMINAL 0.550 |
| ABHP | OVERALL LENGTH | INCHES NOMINAL 1.453 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| PRPY | PROPRIETARY CHARACTERISTICS | PACS |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | TAB, SOLDER LUG 1 AND THREADED STUD 1 |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | MAXIMUM REVERSE VOLTAGE, PEAK 320.0 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE 40.00 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS JUNCTION 200.0 |
| FEAT | SPECIAL FEATURES | NUCLEAR HARDNESS CRITICAL PROCESS; JUNCTION PATTERN ARRANGEMENT: PN |
| CQJX | NOMINAL THREAD SIZE | INCHES 0.250 |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| AXGY | MOUNTING METHOD | THREADED STUD(S) |
| CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
Supersedes
This item replaces cancelled NIIN 000977052. An older drawing citing one of those numbers resolves here.