NSN 5961-01-302-9814 · NIIN 013029814 · FSC 5961
NO DASHES 5961013029814
In Stock
SEMICONDUCTOR DEVICES,UNITIZED
Semiconductor Devices and Associated Hardware
Technical characteristics
13 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABHP | OVERALL LENGTH | INCHES MAXIMUM 0.358 |
| ABKW | OVERALL HEIGHT | INCHES MAXIMUM 0.100 |
| ABMK | OVERALL WIDTH | INCHES MAXIMUM 0.358 |
| ASKA | COMPONENT NAME AND QUANTITY | SEMICONDUCTOR DEVICE DIODE 2 AND TRANSISTOR 2 |
| AXGY | MOUNTING METHOD | PRESS FIT |
| CTMZ | SEMICONDUCTOR MATERIAL | ALL TRANSISTOR SILICON |
| CTMZ | SEMICONDUCTOR MATERIAL | ALL SEMICONDUCTOR DEVICE DIODE SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | ALL SEMICONDUCTOR DEVICE DIODE MINIMUM BREAKDOWN VOLTAGE, DC 70.0 |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | ALL TRANSISTOR MINIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-BASE, EMITTER OPEN 60.0 AND MINIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN 60.0 AND MINIMUM BREAKDOWN VOLTAGE, EMITTER-TO-BASE, COLLECTOR OPEN 5.0 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS CASE 125.0 |
| MATT | MATERIAL | ENCLOSURE CERAMIC OR GLASS |
| TEST | TEST DATA DOCUMENT | DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) 04939-717801326 |
| TTQY | TERMINAL TYPE AND QUANTITY | CASE 20 |
Cross-references
3 manufacturer part numbers on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| 717801326-001 | 30043 |
| 20660 | 04939 |
| 717801326-001 | 04939 |