NSN 5961-00-760-0745 · NIIN 007600745 · FSC 5961
NO DASHES 5961007600745
In Stock
SEMICONDUCTOR DEVICE,DIODE
Semiconductor Devices and Associated Hardware
Technical characteristics
16 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| MATT | MATERIAL | SEMICONDUCTOR SILICON |
| ADAV | OVERALL DIAMETER | INCHES MAXIMUM 0.667 |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | CATHODE |
| AXGY | MOUNTING METHOD | THREADED STUD(S) |
| CTQX | CURRENT RATING PER CHARACTERISTIC | AMPERES MAXIMUM FORWARD CURRENT, DC 300.00 |
| TTQY | TERMINAL TYPE AND QUANTITY | THREADED STUD 1 AND TAB, SOLDER LUG 1 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS CASE 150.0 |
| CQJX | NOMINAL THREAD SIZE | INCHES 0.250 |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | MAXIMUM WORKING PEAK REVERSE VOLTAGE 50.0 |
| CCDG | OVERALL WIDTH ACROSS FLATS | INCHES MINIMUM 0.669 AND INCHES MAXIMUM 0.688 |
| ABHP | OVERALL LENGTH | INCHES MAXIMUM 1.453 |
| ZZZK | SPECIFICATION/STANDARD DATA | GOVERNMENT SPECIFICATION 81349--IL-S-19500 TO 308 |
| TEST | TEST DATA DOCUMENT | SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). 81349--IL-S-19500 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| THSD | THREAD SERIES DESIGNATOR | UNF |