NSN 5962-01-146-1854 · NIIN 011461854 · FSC 5962
NO DASHES 5962011461854
In Stock
MICROCIRCUIT,MEMORY
Microcircuits, Electronic
Technical characteristics
17 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ADAQ | BODY LENGTH | INCHES MAXIMUM 0.960 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.220 AND INCHES MAXIMUM 0.310 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.185 |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| CBBL | FEATURES PROVIDED | PROGRAMMABLE AND BIPOLAR AND W/ENABLE AND HERMETICALLY SEALED |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 12 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | MIL-M-38510 D-6 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 7.0 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 80.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 80.00 |
| CZER | MEMORY DEVICE TYPE | ROM |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |
| TTQY | TERMINAL TYPE AND QUANTITY | PRINTED CIRCUIT 18 |
Cross-references
6 manufacturer part numbers on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| HM1-7643-8 | 34371 |
| 640A560H01 | 48306 |
| 640A560H01 | 97942 |
| 581R504H15 | 97942 |
| ROM/PROM | 16236 |
| 82S137/BVA | 18324 |