NSN 5962-01-260-5451 · NIIN 012605451 · FSC 5962
NO DASHES 5962012605451
In Stock
MICROCIRCUIT,MEMORY
Microcircuits, Electronic
Application: 4935-01-207-5355 TEST STATION,GU
Technical characteristics
20 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ADAQ | BODY LENGTH | INCHES MAXIMUM 0.840 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.220 AND INCHES MAXIMUM 0.310 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.180 |
| AEHX | MAXIMUM POWER DISSIPATION RATING | MILLIWATTS 739.0 |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| AGAV | END ITEM IDENTIFICATION | 4935-01-207-5355 TEST STATION,GU |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND SCHOTTKY AND PROGRAMMABLE AND BIPOLAR |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 6 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | MIL-M-38510 D-2 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 7.0 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 80.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 80.00 |
| CZER | MEMORY DEVICE TYPE | PROM |
| CZZZ | MEMORY CAPACITY | UNKNOWN |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |
| TTQY | TERMINAL TYPE AND QUANTITY | PRINTED CIRCUIT 16 |
Cross-references
4 manufacturer part numbers on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| HM1-7602-5 | 34371 |
| 910001-2 | 51261 |
| M38510/20701BEB | 81349 |
| ROM/PROM FAMILY 022 | 16236 |