NSN 5962-01-277-3327 · NIIN 012773327 · FSC 5962
NO DASHES 5962012773327
In Stock
MICROCIRCUIT,MEMORY
Microcircuits, Electronic
Technical characteristics
15 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ADAQ | BODY LENGTH | INCHES MAXIMUM 1.060 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.220 AND INCHES MAXIMUM 0.310 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.185 |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND PROGRAMMABLE |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 16 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 7.0 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 30.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 30.00 |
| CZER | MEMORY DEVICE TYPE | PAL |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |
Cross-references
7 manufacturer part numbers on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| AMPAL16L8ADMB | 34335 |
| PAL16L8AMJ883B | 50364 |
| 725903-50 | 05869 |
| 725903-1 | 05869 |
| 725903-2 | 05869 |
| 49753-1 | 05869 |
| ROM/PROM FAMILY 049 | 16236 |