NSN 5962-01-326-7916 · NIIN 013267916 · FSC 5962
NO DASHES 5962013267916
In Stock
MICROCIRCUIT,MEMORY
Microcircuits, Electronic
Application: 4935-00-930-7250 TEST STATION,GU
Technical characteristics
18 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ADAQ | BODY LENGTH | INCHES MINIMUM 1.435 AND INCHES MAXIMUM 1.485 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.515 AND INCHES MAXIMUM 0.600 |
| ADAU | BODY HEIGHT | INCHES MINIMUM 0.120 AND INCHES MAXIMUM 0.165 |
| AFGA | OPERATING TEMP RANGE | CELSIUS 0.0 TO 70.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 125.0 |
| AGAV | END ITEM IDENTIFICATION | 4935-00-930-7250 TEST STATION,GU |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND PROGRAMMED AND ELECTROSTATIC SENSITIVE AND ULTRAVIOLET ERASABLE AND BURN IN |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 6.5 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 200.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 200.00 |
| CZER | MEMORY DEVICE TYPE | ROM |
| CZZZ | MEMORY CAPACITY | UNKNOWN |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |
| TTQY | TERMINAL TYPE AND QUANTITY | PRINTED CIRCUIT 24 |
Cross-references
4 manufacturer part numbers on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| D27128-2 | 34649 |
| ROM/PROM FAMILY 091 | 16236 |
| 13335383 | 18876 |
| 13058979 | 18876 |