NSN 6625-01-152-1697 · NIIN 011521697 · FSC 6625
NO DASHES 6625011521697
In Stock
TEST SET,SEMICONDUCTOR DEVICE
Electrical and Electronic Properties Measuring and Testing Instruments
Application: NSN 5826-00-117-7747 CALIBRATION BENCH MOCK UP
Technical characteristics
10 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABGL | WIDTH | MILLIMETERS NOMINAL 250.0 |
| ACYN | AC VOLTAGE RATING | LOCATION NOT OTHERWISE SPECIFIED VOLTS NOMINAL 115.0 |
| ACZB | FREQUENCY RATING | LOCATION NOT OTHERWISE SPECIFIED HERTZ NOMINAL 60.0 |
| AEJZ | DEPTH | MILLIMETERS NOMINAL 286.0 |
| AGAV | END ITEM IDENTIFICATION | NSN 5826-00-117-7747 CALIBRATION BENCH MOCK UP |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| ANPZ | ENCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| AQXY | TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT TESTING OF COMPONENTS |
| FAAZ | PHASE | LOCATION NOT OTHERWISE SPECIFIED SINGLE |
| HGTH | HEIGHT | MILLIMETERS NOMINAL 86.0 |
Cross-references
1 manufacturer part number on file for this NSN — each shown against the CAGE code it belongs to.
| Manufacturer part number | CAGE |
|---|---|
| 3110 | 34160 |