NSN 6625-01-419-8132 · NIIN 014198132 · FSC 6625
NO DASHES 6625014198132
In Stock
TEST SET,SEMICONDUCTOR DEVICE
Electrical and Electronic Properties Measuring and Testing Instruments
Application: COMMON TEST EQUIPMENT
Technical characteristics
4 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| AGAV | END ITEM IDENTIFICATION | COMMON TEST EQUIPMENT |
| ANPZ | ENCLOSURE FEATURE | MULTIPLE ITEM W/HOUSING |
| AQXY | TEST TYPE FOR WHICH DESIGNED | PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES |
| PDNB | PURCHASE DESCRIPTION IDENTIFICATION | 1T110CONTRACT/F41608-94-C-0785 |