NSN 5962-01-122-9312 · NIIN 011229312 · FSC 5962
NO DASHES 5962011229312
In Stock
MICROCIRCUIT,DIGITAL
Microcircuits, Electronic
Technical characteristics
14 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ADAQ | BODY LENGTH | INCHES MINIMUM 0.755 AND INCHES MAXIMUM 0.785 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.245 AND INCHES MAXIMUM 0.280 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.180 |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND POSITIVE OUTPUTS AND SCHOTTKY |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | DUAL 4 INPUT |
| CSSL | DESIGN FUNCTION AND QUANTITY | GATE, NAND 2 |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | JOINT ELECTRON DEVICE ENGINEERING COUNCIL TO-116 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 4.50 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 5.00 |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |