NSN 5962-00-319-3035 · NIIN 003193035 · FSC 5962
NO DASHES 5962003193035
In Stock
MICROCIRCUIT,DIGITAL
Microcircuits, Electronic
Technical characteristics
15 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND EXPANDABLE AND W/DECODED OUTPUT |
| ADAU | BODY HEIGHT | INCHES MINIMUM 0.120 AND INCHES MAXIMUM 0.195 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.245 AND INCHES MAXIMUM 0.300 |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | JOINT ELECTRON DEVICE ENGINEERING COUNCIL -0-001-AG |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| ADAQ | BODY LENGTH | INCHES MINIMUM 0.750 AND INCHES MAXIMUM 0.795 |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 35.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 30.00 |
| CSSL | DESIGN FUNCTION AND QUANTITY | COMPARATOR, MAGNITUDE 1 |
| TEST | TEST DATA DOCUMENT | STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). 96906--IL-STD-883 |
| CQZP | INPUT CIRCUIT PATTERN | 11 INPUT |
| CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
| AEHX | MAXIMUM POWER DISSIPATION RATING | MILLIWATTS 485.0 |