NSN 6625-01-217-7608 · NIIN 012177608 · FSC 6625
NO DASHES 6625012177608
In Stock
TEST SET,ELECTRONIC CIRCUIT-COMP
Electrical and Electronic Properties Measuring and Testing Instruments
Technical characteristics
3 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET ELECTRONIC CIRCUIT-COMPONENT: 105-130V 50/60HZ |
| FEAT | SPECIAL FEATURES | HAS 3 SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATES ON 120/230 VAC, 50/60 HZ, SINGLES PHASE; COMES W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE OF MEDICAL EQUIPMENT; HAS PULSE GENERATION CAPABILITIES W/A SELECTABLE RANGE FROM 60 HZ TO 2 KHZ; OUTPUT AMPLITUDE AT LEAST 0 TO 5 VOLTS PEAK, CURRENT UP TO 50 MA AND IMPEDANCE OF 100 OHMS; UNIT SELECTOR SWITCH(S)/TERMINALS DESCRIBE FUNCTION, RANGE AND/OR TEST; PROVISIONED AS FOLLOWS: DPSC-A SPECIAL EQUIPMENT COMMERCIAL SERVICE MANUAL; DPSC-B SPECIAL EQUIPMENT COMMERCIAL OPERATING/INSTRUCTION MANUAL; DI-ILSS-80867 SPECIAL EQUIPMENT CONSUMABLE/DURABLE SUPPORT ITEM LIST |
| TEXT | GENERAL CHARACTERISTICS ITEM DESCRIPTION | FOR TESTING CAPACITORS FOR SHORTS, OPENS, AND LEAKAGE FROM 0.001 TO 25 MICRO FARADS. TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS. TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE, SHORTS AND OPEN BONDING, TO INCLUDE ZENOR DIODES, BIPOLAR TRANSISTORS, TRIACS, AND OPTEOELECTRONIC DEVICES. TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE. |
Supersedes
This item replaces cancelled NIIN 012550839. An older drawing citing one of those numbers resolves here.