NSN 5962-00-193-0317 · NIIN 001930317 · FSC 5962
NO DASHES 5962001930317
In Stock
MICROCIRCUIT,DIGITAL
Microcircuits, Electronic
Application: TEST SET,RADAR,TYPE AN/UPM-137
Technical characteristics
18 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| CQZP | INPUT CIRCUIT PATTERN | DUAL 5 INPUT |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| ADAQ | BODY LENGTH | INCHES MINIMUM 0.750 AND INCHES MAXIMUM 0.785 |
| ADAT | BODY WIDTH | INCHES MINIMUM 0.240 AND INCHES MAXIMUM 0.280 |
| ADAU | BODY HEIGHT | INCHES MAXIMUM 0.200 |
| CQWX | OUTPUT LOGIC FORM | DIODE-TRANSISTOR LOGIC |
| CZEQ | TIME RATING PER CHACTERISTIC | NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT 80.00 AND NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT 30.00 |
| TEST | TEST DATA DOCUMENT | DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) 45413-134195 |
| TTQY | TERMINAL TYPE AND QUANTITY | PRINTED CIRCUIT 14 |
| CSSL | DESIGN FUNCTION AND QUANTITY | GATE, NAND-NOR 2 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| AFGA | OPERATING TEMP RANGE | CELSIUS -55.0 TO 125.0 |
| AFJQ | STORAGE TEMP RANGE | CELSIUS -65.0 TO 150.0 |
| AGAV | END ITEM IDENTIFICATION | TEST SET,RADAR,TYPE AN/UPM-137 |
| CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND MEDIUM SPEED AND EXPANDABLE AND LOW POWER |
| CQSJ | INCLOSURE MATERIAL | GLASS AND METAL |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | VOLTS MAXIMUM POWER SOURCE 5.5 |
| AEHX | MAXIMUM POWER DISSIPATION RATING | MILLIWATTS 40.0 |