NSN 5961-01-319-1730 · NIIN 013191730 · FSC 5961
NO DASHES 5961013191730
In Stock
SEMICONDUCTOR DEVICE,DIODE
Semiconductor Devices and Associated Hardware
Technical characteristics
14 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABHP | OVERALL LENGTH | INCHES NOMINAL 1.313 |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-203AB |
| AXGY | MOUNTING METHOD | THREADED STUD(S) |
| CCDG | OVERALL WIDTH ACROSS FLATS | INCHES NOMINAL 0.678 |
| CQJX | NOMINAL THREAD SIZE | INCHES 0.250 |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | MAXIMUM REPETITIVE PEAK REVERSE VOLTAGE 45.0 AND MAXIMUM WORKING PEAK REVERSE VOLTAGE 45.0 AND MAXIMUM REVERSE VOLTAGE, INSTANTANEOUS 45.0 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | AMPERES MAXIMUM REPETITIVE PEAK FORWARD CURRENT 120.00 AND AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE 60.00 AND AMPERES MAXIMUM REPETITIVE PEAK REVERSE CURRENT 2.00 AND AMPERES MAXIMUM PEAK FORWARD SURGE CURRENT 800.00 |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | CELSIUS JUNCTION 150.0 |
| MATT | MATERIAL | ENCLOSURE GLASS |
| MATT | MATERIAL | SEMICONDUCTOR SILICON |
| SPCL | SPECIAL TEST FEATURES | RECOVERY TIME |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | TAB, SOLDER LUG 1 AND THREADED STUD 1 |