NSN 6625-01-225-7434 · NIIN 012257434 · FSC 6625
NO DASHES 6625012257434
In Stock
TEST SET,SEMICONDUCTOR DEVICE
Electrical and Electronic Properties Measuring and Testing Instruments
Technical characteristics
9 rows
Straight from the federal item record. Entries the record leaves empty are shown empty — nothing is filled in on its behalf.
| MRC | Requirement | Value |
|---|---|---|
| ABGL | WIDTH | INCHES NOMINAL 3.750 |
| AEJZ | DEPTH | INCHES NOMINAL 6.600 |
| AKWC | ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| ANPZ | ENCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| AQXY | TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT & OUT OF CIRCUIT TESTING; DEVICE POLARITY; IDENTIFICATION OFBASE LEADS |
| AQXZ | OPERATING TEST CAPABILITY | BASE DRIVE: 250 MA (HI) OR 1 MA (LO); REPITION RATE: 5 HZ |
| CBBL | FEATURES PROVIDED | INTERNAL BATTERY ACCOMMODATION |
| HGTH | HEIGHT | INCHES NOMINAL 1.750 |
| PRPY | PROPRIETARY CHARACTERISTICS | PACS |
Supersedes
This item replaces cancelled NIIN 011825721. An older drawing citing one of those numbers resolves here.